Products: The UltraSTEM^™ range

For the latest specifications and results from our microscopes, please see our results page.

Atomic-resolution EELS chemical composition map taken on the Nion UltraSTEM 100 microscope. V = red, La = green, Ti = blue. Yellow arrows point to purple bands showing V/Ti intermixing. This 128x375 pixel spectrum-image was taken at 10ms/pix (~15 min total acquisition) with no drift compensation. (Courtesy L. Fitting-Kourkoutis & D. Muller) ADF image of monolayer boron nitride containing atomic substitutions. Quantitative analysis of the image produced a detailed atomic model, which is shown superposed on the image. Boron atoms are shown red, carbons atoms yellow, nitrogen atoms green and oxygen atoms blue. Graphic courtesy Tim Pennycook, ORNL & Vanderbilt U.

Nion microscopes have been designed from the “ground up”. This has allowed them to avoid having any “historical design baggage” that is typically found in other electron microscopes. The result is an integrated performance second to none. Nion microscopes have many features not found in other instruments, with benefits that increase productivity and provide opportunities for new kinds of experiments: Feature Benefit >0.5 nA current in an atom-sized probe Rapid atomic-resolution EELS elemental mapping Correction of all fifth-order axial aberrations Larger probe angles, higher beam current Every operation can be performed remotely Remote operation with no local assistance Computer-controlled sample exchange Samples can be changed by remote users Up to 5 samples stored in storage chamber Rapid sample change – no waiting for vacuum to recover Friction-free, centro-symmetric sample stage Ultra-precise sample motion, freedom from drift Double tilt holder with ball bearing mechanics Ultra-precise sample tilting Fast electrostatic beam blanker Avoids sample damage when not collecting data 3rd-order-corrected EELS coupling optics >50 mr acceptance semi-angles, more efficient analysis Optional pre-corrector scanning Aberration-corrected conical illumination scanning Microscope column is entirely ion-pumped Minimizes sample contamination and etching Column uses only metal vacuum seals Sample vacuum typically <1x10-9 torr Whole column bakeable to 140°C Eliminates microscope-caused contamination Double μ-metal shielding of entire column Minimizes sensitivity to stray AC fields Completely modular construction Column can be reconfigured after installation Self-diagnosing electronics Rapid remote servicing

More specifics of the unique features available on Nion microscopes are given on our technology page.

Nion UltraSTEM^™ 100

Medium angle annular dark field (MAADF) images of the edge of graphene, taken 2 minutes apart. Note the extensive rearrangement that occurred at the edge, and the heavier adatom (probably Al) dangling off the edge. Single arrows in4 (a) show five-fold C rings, the double arrow shows a single atom of C dangling off the edge. Nion UltraSTEM™ 100, 60 keV. (Krivanek et al., Ultramicroscopy 110 (2010) 935-945)

The UltraSTEM™ 100 is a high-performance dedicated scanning-transmission electron microscope (STEM) with many unique features. Its flexible column provides < 1 Å resolution imaging as well as rapid nanoanalysis with an atom-sized electron probe containing > 0.5 nA of current, and efficient coupling into a variety of detectors. It can also produce high-quality diffraction patterns and even CTEM images. The UltraSTEM™ has produced atomic-resolution elemental maps in less than a minute (see results). This promises to lead to a new era in electron microscopy in which atomic-resolution elemental maps become a powerful addition to the range of available microscopy techniques. It has also produced unsurpassed images of graphene and similar light-Z materials, while operating at 60 keV, below the knock threshold for C and other light atoms. The principal design elements of the UltraSTEM that have made this advance possible are: high-brightness cold field emission electron gun (CFEG) high-performance 3rd generation C3/C5 aberration corrector ultra-stable sample stage using detachable sample cartridges optimized EELS coupling optics UHV construction complete remote operability, including sample exchange Many of these features are unique to the Nion microscope. A full description of the microscope was published in Ultramicroscopy.

Custom solutions

Nion is a small and responsive company whose scientists and engineers are deeply knowledgeable about electron microscopes and very interested in pursuing new applications. Our UltraSTEM microscopes are completely modular; all the modules of the microscope column use the same exact mating surface. They can therefore be stacked in almost any sequence and total number. The vacuum system, the electronics, and the detector column are also modular. This means that the column can be reconfigured in many different and unique configurations.

Nion Service

The service of Nion microscopes is based on four principles:

• Remote diagnosis. The Nion microscope is completely remotely operable. If a problem appears, Nion personnel typically diagnose it by operating the microscope remotely, within 24 hours of the problem being reported.
• Modularity. Because the microscope is modular, the number of different types of spare parts (PCBs, cables, mechanical modules) is minimized. Nion is typically able to ship a replacement for a defective module that can be installed by the customer within 24 hours of the diagnosis becoming clear.
• Site Service. More challenging problems requiring an on-the-spot intervention are typically resolved with a visit by the Nion expert specializing in that particular subsystem. Customers therefore do not have to go through several visits by service engineers who are not sufficiently familiar with the full complexities of the microscope and end up passing the problem onto a higher level in the service organization.
• Update visits. As a part of the Nion service plan, Nion engineers visit the site at least once a year to carry out major software updates and customer training refreshers.