The following is a list of key publications on Nion microscopes and aberration correctors, and the work done with them. This list is not comprehensive.

• First atomic-resolution compositional and bonding mapping by EELS done in less than 1 minute:
  D. A. Muller, L. Fitting Kourkoutis, M. Murfitt, J. H. Song, H. Y. Hwang, J. Silcox, N. Dellbyand , O. L. Krivanek. (2008) “Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy”, Science 319, 1073.


• Technical description of the design of the UltraSTEM™ 100:
  Krivanek O.L., Corbin G.J., Dellby N. , Elston B.F., Keyse R.J., Murfitt M.F., Own C.S., Szilagyi Z.S., Woodruff J.W. (2008) “An electron microscope for the aberration-corrected era”, Ultramicroscopy 108, 179.


• First demonstration of atomic-resolution EELS mapping:
  Bosman M., Keast V.J., Garcia-Munoz J. L. , D’Alfonso A. J., Findlay S. D., and Allen L.J. (2007) “Two-Dimensional Mapping of Chemical Information at Atomic Resolution”, Phys Rev Lett. 99, 086102.


• Technical description of the Nion C₃/C₅ corrector:
  Dellby N., Krivanek O.L. and Murfitt M.F. (2006) “Optimized quadrupole-octupole C3/C5 corrector for STEM”, CPO-7 proceedings, p. 97.


• First demonstration of directly interpretable deep sub-A resolution in an electron microscope:
  Nellist P.D., M. F. Chisholm, N. Dellby, O. L. Krivanek, M. F. Murfitt, Z. S. Szilagyi, A. R. Lupini, A. Borisevich, W. H. Sides and S. J. Pennycook, (2004) “Direct sub-angstrom imaging of a crystal lattice”Science 305, 1741-1741. .


• First identification of a single atom in a bulk solid by EELS:
  Varela M., Findlay S.D., Lupini A.R., Christen H.M., Borisevich A.Y., Dellby N., Krivanek O.L., Nellist P.D., Oxley M.P., Allen L.J. and Pennycook S.J. (2004) “Spectroscopic Imaging of Single Atoms Within a Bulk Solid “, Phys. Rev. Lett. 92, 095502.


• First directly interpretable sub-Å imaging in an electron microscope:
  Batson P.E., Dellby N. and Krivanek O.L. (2002) “Sub-ångstrom resolution using aberration corrected electron optics”, Nature 418, 617.


• First working quadrupole/octupole probe Cs corrector:
  Krivanek O.L., Dellby N., Spence A.J., Camps R.A., and Brown L.M. (1997) “Aberration correction in the STEM”, in: Inst. Phys. Conf. Ser. 153 (Proceedings 1997 EMAG meeting) Ed. Rodenburg JM, 35.

Classic papers on early aberration correctors:

• Theoretical proof that C_s and C_c are unavoidable with round electron lenses:
  Scherzer O. (1936) "Über einige Fehler von Elektronenlinsen", Z. Physik 101, 593.


• Theoretical analysis of different ways to correct aberrations of round electron lenses, first theoretical corrector designs:
  Scherzer O. (1947) "Spharische und chromatische korrektur von elktronen-linsen", Optik 2,114.


• First proof-of-principle C_s / C_c corrector:
  Seeliger R. (1953) "Über die justierung spharisch korrigierter elektronenoptischer systeme", Optik 10, 29.
  Möllenstedt G. (1956) "Elektronenmikroskopische bilder mit einem nach. O. Scherzer spharisch korrigierten Objektiv", Optik 13, 209.


• First proposal for a quadrupole-octupole C_s corrector:
  Archard G.D. (1955) "2 new simplified systems for the correction of spherical aberration in electron lenses", Proc. Roy Soc. B68 156.


• First proof-of-principle quadrupole/octupole probe C_s corrector:
  Deltrap J.H.M. (1964a) "Correction of spherical aberration with combined quadrupole-octopole units", Proc. EUREM-3, Prague, 45.


• First proposal for using sextupoles as a C_s-correcting element:
  Beck V. (1979) "Hexapole spherical-aberration corrector", Optik 53, 241.


• First theoretical design for a C₃/C₅ sextupole/round lens/sextupole corrector:
  Shao Z. (1988) "On the fifth order aberration in a sextupole corrected probe forming system", Rev. Sci. Instrum. 59, 2429.


• Theoretical design on which the CEOS sextupole/round lens/sextupole corector is based:
  Rose H. (1990) "Outline of a spherically corrected semiaplanatic medium-voltage transmission electron-microscope", Optik 85, 19.


• First proof-of-principle sextupole/round lens/sextupole probe C_s corrector:
  Chen E. and Mu C. (1990) "New development in correction of spherical aberration of electro-magnetic round lens" Proc. Int. Symp. Electron Microscopy, K.Kuo and J. Yao, eds, World Scientific, 28.


• First working sextupole/round lens/sextupole image C_s corrector:
  1. Haider M., Braunshausen G. and Schwan E. (1995) "Correction of the spherical-aberration of a 200-KV TEM by means of a hexapole-corrector", Optik 99, 167.
  2. Haider M., Rose H., Uhlemann S., Kabius B., and Urban K. (1998) "Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope", Journal of Electron Microscopy 47, 395.

Reviews and general references:

• Brief but broad summary of aberration correction research:
  Hawkes P.W. (2001) "The long road to spherical aberration correction", Biology of the Cell 93, 432−439.


• History of electron optics from a French perspective, with emphasis on aberration correction:
  Hawkes P.W. (2004) "Recent advances in electron optics and electron microscopy", Annales de la Fondation Louis de Broglie, 29, Hors série 1, 837-55.

Selected websites of users of Nion microscopes and correctors:

• STEM at IBM Research, TJ Watson Research Center, Yorktown NY, USA
  


• The STEM Group, Oak Ridge National Laboratories, Oak Ridge TN, USA


• The SuperSTEM Facility, Daresbury, UK


• Muller Group Facilities, Cornell University, Ithaca NY, USA


• STEM Group, Universite Paris Sud, Orsay, France